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Your selections:
High performance raster scanning of atomic force microscopy using Model-free Repetitive Control
- Li, Linlin, Fleming, Andrew J., Yong, Yuen K., Aphale, Sumeet S., Zhu, LiMin
Damping and tracking controllers for nanopositioning systems: applications for high-speed scanning probe microscopy
- Teo, Yik Ren
Tracking control of a monolithic piezoelectric nanopositioning stage using an integrated sensor
- Omidbeike, Meysam, Teo, Yik R., Yong, Yuen K., Fleming, Andrew J.
Optimal integral force feedback and structured PI tracking control: application for objective lens positioner
- Teo, Yik R., Russell, Douglas, Aphale, Sumeet S., Fleming, Andrew J.
Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis
- Maess, Johannes, Fleming, Andrew J., Allgoewer, Frank
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